diffraction of electron
英 [dəˈfrækʃən ɒv ɪˈlektrɒn]
美 [dəˈfrækʃən əv ɪˈlektrɑːn]
【电】电子的绕射
双语例句
- The Analysis Quantitatively the Grating Diffraction of Electron Probability Wave
物质波光栅衍射的定量分析 - The structures of the films were determined by X-ray diffraction. The size and shape of the Ag particles were observed by transmission electron microscopy. The X-ray photoelectron spectroscopy results showed that Ag is in the metallic state.
通过X射线衍射对薄膜的结构进行了表征，利用透射电子显微镜对Ag纳米颗粒的尺寸、形态进行了观测，X射线光电子能谱结果表明Ag呈金属态。 - The structure and composition of GaN crystal were studied by X-ray diffraction ( XRD) and fourier transform infrared spectrophotometer ( FTIR). The morphology of the samples was studied by scanning electron microscopy ( SEM).
用X射线衍射（XRD）、红外傅里叶变换光谱（FTIR）分析了GaN晶体的结构和组分，利用扫描电子显微镜（SEM）观察了样品的形貌。 - Obtaining the Electron Diffraction Pattern of Crystal with WDY-3 Type Electron Diffraction Instrument
用WDY-3型电子衍射仪获得单晶衍射图象 - A Quantitative Analysis of Two-slit and Multiple-Slit Diffraction of Single Electron
单电子双缝及多缝衍射的定量分析 - The crystal structure and its lattice parameter of sapphire single crystal grown by EFG method was determined by selected area diffraction of transmission electron micrograph ( TEM).
用透射电镜选区电子衍射（TEM）方法测试了导模法生长的白宝石单晶体的晶体结构和点阵常数。 - X-ray Diffraction ( XRD) is used to study the components of the sample and High Resolution Transmission Electron Microscope ( HRTEM) is used to study the microstructure of the nano GaN crystal.
用X射线衍射（XRD）分析了硅片上的纳米晶成分，并用高分辨电镜（HRTEM）观察了该实验条件下生长的一维GaN纳米晶的微观结构。 - Its electron diffraction pattern shows symmetrical and clear electron diffraction spots of single crystal and proved to be the electron diffraction pattern of single crystal by means of index with the parameters of unit cell of Nylon 1010.
对该晶体进行电子衍射，显示对称的清晰的单晶电子衍射斑点，用尼龙1010的晶胞参数标定电子衍射图，证明是单晶的电子衍射图。 - The Monte Carlo method is used to electronic distribution in electron cloud and electron diffraction. The distribution graphes of the electron cloud in atom and molecule are drawn and the phenomenon of the electron diffraction from a single slit or a small aperture is simulated vividly.
运用蒙特卡罗方法处理了电子云和电子衍射中非均匀电子的产生问题，形象的绘制了原子、分子中的电子云分布图形，生动的模拟了单缝（小孔）电子衍射实验现象。 - The uncertainty principle can be obtained from the commutator of operators or from the diffraction of electron.
不确定原理可以从算符的对易关系中严格地导出，也可以由电子的衍射中定性地简单导出。 - This paper presents a way for obtaining the electron diffraction pattern of crystal Mica film with WDY-3 Type electron diffraction instrument.
本文介绍用WDY&3型电衍子射仪获得单晶透射衍射图象的方法。 - The high-resolution images and corresponding electron diffraction patterns of YBCO films were obtained with the aid of high-resolution transmission electron microscope ( HRTEM).
在高分辨透射电子显微镜（HRTEM）下获得了薄膜的高分辨图像及电子衍射花样。 - Computer Simulation of Two-slit Diffraction of Electron Based on Monte Carlo Method
基于蒙特卡罗的电子双缝衍射的计算机模拟 - The sizes of SnO 2 nanocrystallines were determined by dynamic light scattering, X-ray diffraction, and computer analysis of nanocrystalline images of transmission electron microscopy.
通过动态光散射、X射线衍射和晶粒透射电子显微镜像测量，确定了SnO2晶粒的线度。 - The Theoretical Analysis of the Diffraction Intensity of X-rays in the Electron Probe and the Feasibility of the Medium Standard Method
电子探针中的X射线衍射强度的理论分析及中间标样法实行的可能性 - The morphology of TiC whisker is analyzed by the phase analysis of X-ray diffraction, the detection of electron diffraction, and the observation of scan electron microscope.
经X射线物相分析、电子衍射测定和扫描电镜观测，分析了TiC晶须的形貌。 - A method for correcting the low scattering angle electron diffraction intensities by means of the high resolution electron microscope image to reduce the dynamical effects is proposed.
针对高分辨电子显微学和电子衍射相结合测定晶体结构的图像处理技术，提出了一种借助高分辨电子显微像来校正低散射角电子衍射强度动力学效应的新方法。 - The designed electron diffraction system consists of an ultra-fast electron gun, a sample chamber, a readout system, a power supply system, and a vacuum system, and it bears such unique characteristics as high energy, high temporal resolution, and high detection capacity.
研发的超快电子衍射系统由超快电子枪、样品室、超快读出系统、电源系统，以及真空系统等组成，该超快电子衍射系统具有较高的时间分辩能力和较强的探测能力。 - Correcting The Dynamical Effect of Electron Diffraction Intensity by means of High resolution Electron Microscope Image
借助高分辨电子显微像校正电子衍射强度的动力学效应 - X-ray diffraction ( XRD) in different temperature of hot pressing was used to determine the phase composition and scanning electron microscope ( SEM) was observed to investigate the microstructure of samples synthesized respectively.
通过不同温度下合成试样的X-射线衍射分析（XRD），确定了热压合成试样的物相组成，并用扫描电子显微镜（SEM）观察了所合成试样的显微结构。 - A series map of selected area electron diffraction patterns ( SADPs) of Γ 1 phase in commercial galvannealed IF steel sheets were investigated by transmission electron microscopy ( TEM). The cross-sectional TEM specimen was prepared using focused ion beam ( FIB) technique.
采用聚焦离子束（FIB）方法制备了合金化热镀锌IF钢横截面TEM试样，研究了镀层中Γ1相显微结构，得到了Γ1相选区电子衍射花样（SADPs）。 - In this paper, the grating diffraction of electron probability wave is taken for example, Feynman's path integral theory is used to analyse quantitatively the electron diffraction state. This method is brief and clear.
用费曼的路径积分理论对电子概率波通过光栅所产生的衍射效应进行了定量分析，该方法简便、直观。 - The diffraction state of electron solved by the method of path integrals
用路径积分法求解电子的衍射态 - Crystalline behavior of segmented polyester polyurethaneurea ( PUU) elastomers at different annealing conditions was studied by wide-angle X-ray diffraction ( WAXD), and crystalline morphologies of the fracture surface of these materials were investigated by scanning electron microscopy ( SEM).
用宽角X-ray衍射（WAXD）研究了嵌段聚酯脲氨酯（PUU）弹性体在不同退火条件下的结晶行为，用扫描电子显微镜（SEM）研究了这些材料断面上的结晶形态。 - The chemical and crystal structures of hydroxyapatite were characterized by fourier transform infrared spectra ( FTIR) and X-Ray diffraction ( XRD), the morphology and the size of particle of hydroxyapatite was observed by transmission Electron Microscopy ( TEM) respectively.
用红外光谱和X射线衍射仪等手段来分析羟基磷灰石的化学结构和结晶状态，用透射电子显微镜观察羟基磷灰石的微观状态和粒子尺寸。 - The continuous miniaturization of conventional silicon-based electronics will eventually face the insurmountable challenge of the quantum effect, such as tunneling, diffraction, and interference of electron.
随着传统硅基电子器件的尺寸不断缩小，当它们的尺寸逼近纳米数量级时，将面临因量子效应（如隧穿，散射和电子干涉等）而产生的一系列难以逾越的挑战。 - The crystalline phases of samples are investigated by X-Ray diffraction ( XRD). The distribution and morphology of pores are studied by environmental scanning electron microscopy ( SEM).
运用X射线衍射分析仪对样品的物相进行了分析，利用环境扫描电子显微镜观察了样品中气孔的孔径大小、形状及分布情况。 - And the use of experimental instruments and X ray diffraction ( XRD), scanning electron microscopy ( SEM) on experimental results of characterization, and the electron energy loss spectroscopy.
并利用实验仪器X射线衍射（XRD）、扫描电子显微镜（SEM）对实验结果进行表征，根据电子能量损失谱得到实验数据。 - For high energy electron diffraction in a crystal, we obtain the wave function by Bloch wave method. The quantum trajectories then present the formation process of electron channeling in crystal.
对于晶体中的高能电子衍射，我们采用Bloch波方法计算得到了高能电子在晶体中衍射的波函数，量子轨迹则显示了电子在晶体中通道的形成过程。